Display device

ABSTRACT

A display device according to a present disclosure comprises: a display region; a frame region disposed around the display region; a plurality of first wirings extending in a first direction in the display region; a first drive circuit electrically connected to one end of each of the plurality of first wirings; a first inspection wiring electrically connected to another end of each of the plurality of first wirings through each of a plurality of inspection thin film transistors; a second inspection wiring connected to a gate electrode of each of the plurality of inspection thin film transistors; an inspection drive circuit electrically connected to the second inspection wiring; and an inspection circuit electrically connected to the first inspection wiring, wherein at least a part of the second inspection wiring extends in the first direction in the display region.

CROSS-REFERENCE TO RELATED APPLICATION

This application claims priority from Japanese application JP2018-220971, filed Nov. 27, 2018. This Japanese application isincorporated herein by reference.

BACKGROUND 1. Technical Field

The present invention relates to a display device.

2. Description of the Related Art

A display device described in Unexamined Japanese Patent Publication No.2015-018144 includes a plurality of inspection transistors connected toinspect disconnection of a gate line and a data line. In a disconnectioninspection process, the inspection transistor is turned on, and anamount of current passed through the inspection transistor and an amountof charge are measured, whereby the disconnection of the gate line andthe data line can be inspected.

SUMMARY

However, in the conventional display device, there is a problem that anarea of a frame region disposed around a display region of the displaydevice is enlarged. That is, in the conventional configuration, the areaof the frame region is enlarged according to the area where wiring isdisposed to turn on the inspection transistor.

The present disclosure has been made in view of the above circumstances,and an object of the present disclosure is to reduce the area of theframe region in the display device having the function of inspectingwiring extending in the display region.

To solve the above problem, a display device according to a presentdisclosure comprises: a display region; a frame region disposed aroundthe display region; a plurality of first wirings extending in a firstdirection in the display region; a first drive circuit electricallyconnected to one end of each of the plurality of first wirings; a firstinspection wiring electrically connected to another end of each of theplurality of first wirings through each of a plurality of inspectionthin film transistors; a second inspection wiring connected to a gateelectrode of each of the plurality of inspection thin film transistors;an inspection drive circuit electrically connected to the secondinspection wiring; and an inspection circuit electrically connected tothe first inspection wiring, wherein at least a part of the secondinspection wiring extends in the first direction in the display region.

The liquid crystal display device according to the present disclosurecan improve the aperture ratio in the lateral electric field systemliquid crystal display device.

BRIEF DESCRIPTION OF DRAWINGS

FIG. 1 is a plan view illustrating a schematic configuration of displaydevice according to an exemplary embodiment.

FIG. 2 is a schematic diagram illustrating a disposition relationship ofvarious wirings in display device according to the exemplary embodiment.

FIG. 3 is an equivalent circuit diagram illustrating a schematicconfiguration of display device according to the exemplary embodiment.

FIG. 4 is a plan view illustrating a schematic configuration of displaydevice according to another example of the exemplary embodiment.

FIG. 5 is a schematic diagram illustrating a disposition relationship ofvarious wirings in display device according to the exemplary embodiment.

FIG. 6 is a schematic diagram illustrating a disposition relationship ofvarious wirings in display device according to the exemplary embodiment.

FIG. 7 is a schematic diagram illustrating a disposition relationship ofvarious wirings in display device according to the exemplary embodiment.

Hereinafter, an exemplary embodiment of the present disclosure will bedescribed with reference to the drawings. In the exemplary embodiment, aliquid crystal display device is described as an example of displaydevice. However the present disclosure is not limited to the liquidcrystal display device. For example the present disclosure may be anorganic electroluminescence display (OLED) device.

FIG. 1 is a plan view illustrating a schematic configuration of displaydevice 100 according to an exemplary embodiment. As illustrated in FIG.1, display device 100 of the present exemplary embodiment includesdisplay region 10 that displays an image and frame region 20 disposedaround display region 10. First drive circuit 30, inspection circuit 50,and inspection drive circuit 60 are disposed in frame region 20. Forexample, first drive circuit 30 is a source line drive circuit or a gateline drive circuit. An example in which first drive circuit 30 is thesource line drive circuit will be described in the present exemplaryembodiment.

FIG. 2 is a schematic diagram illustrating a disposition relationship ofvarious wirings in display device 100 of the present exemplaryembodiment. As illustrated in FIG. 2, display device 100 includes aplurality of first wirings 31 extending in a first direction in displayregion 10. For example, first wiring 31 is a source line or a gate line.An example in which first wiring 31 is the source line will be describedin the present exemplary embodiment. One end of each of the plurality offirst wirings 31 is electrically connected to first drive circuit 30 inFIG. 1.

As illustrated in FIG. 2, an inspection thin film transistor 53 isdisposed at the other end of each of the plurality of first wirings 31,and the plurality of first wirings 31 are connected to first inspectionwiring 51 through inspection thin film transistors 53. The other end offirst inspection wiring 51 is electrically connected to inspectioncircuit 50 in FIG. 1.

As illustrated in FIG. 2, second inspection wiring 52 is connected to agate electrode of each of the plurality of inspection thin filmtransistors 53. One end of the second inspection wiring 52 is connectedto inspection drive circuit 60 in FIG. 1, and at least a part of secondinspection wiring 52 extends in the first direction in display region10.

With this configuration, the area of frame region 20 in FIG. 1 can bereduced in display device 100 having a function of inspecting the wiringextending in display region 10. That is, in display device 100 of thepresent disclosure, at least a part of second inspection wiring 52through which a signal for turning on inspection thin film transistor 53is transmitted is disposed in display region 10, so that a space inwhich second inspection wiring 52 is disposed can be reduced in frameregion 20, and therefore the area of frame region 20 can be reduced.

A more specific configuration of display device 100 of the presentexemplary embodiment will be described below with reference to thedrawings.

As illustrated in FIG. 1, in display device 100 of the present exemplaryembodiment, second drive circuit 40 is disposed in frame region 20, inaddition to first drive circuit 30 and inspection circuit 50. In theexample of FIG. 1, inspection circuit 50 and inspection drive circuit 60are disposed in first edge side region 20A of frame region 20. In frameregion 20, second drive circuit 40 is disposed in edge side region 20Cintersecting with first edge side region 20A where first drive circuit30 is disposed. For example, second drive circuit 40 is a gate linedrive circuit or a source line drive circuit. An example in which seconddrive circuit 40 is the gate line drive circuit will be described in thepresent exemplary embodiment.

As illustrated in FIG. 2, in display region 10, display device 100includes a plurality of second wirings 41 extending in a seconddirection intersecting with the first direction. For example, secondwirings 41 is a gate line or a source line, and an example in whichsecond wiring 41 is the gate line will be described in the presentexemplary embodiment. The plurality of second wirings 41 areelectrically connected to second drive circuit 40 in FIG. 1.

FIG. 3 is an equivalent circuit diagram illustrating a schematicconfiguration of display device 100 of the present exemplary embodiment.As described above with reference to FIG. 2, display device 100 includessource lines as the plurality of first wirings 31 extending in the firstdirection and gate lines as the plurality of second wirings 41 extendingin the second direction. Thin film transistor 13 is provided at anintersection of each source line and each gate line.

In display device 100, a plurality of pixels 14 are arranged in thefirst direction and the second direction according to the intersectionsof the source lines and the gate lines. Although not illustrated,display device 100 includes a thin film transistor substrate, a colorfilter substrate, and a liquid crystal layer sandwiched between the twosubstrates. In the thin film transistor substrate, a plurality of pixelelectrodes 15 are provided according to pixels 14. Common electrode 16common to pixels 14 is provided in the color filter substrate. Commonelectrode 16 may be provided in the thin film transistor substrate.

A source signal is supplied from first drive circuit 30 in FIG. 1 toeach source line (first wiring 31). A gate-on voltage is supplied fromsecond drive circuit 40 in FIG. 1 to each gate line (second wiring 41).A common voltage is supplied from a common electrode drive circuit (notillustrated) to common electrode 16 through common line 17. When thegate-on voltage is supplied to the gate line, thin film transistor 13connected to the gate line is turned on, and a source voltage that isthe source signal is supplied to pixel electrode 15 through the sourceline connected to thin film transistor 13. An electric field isgenerated by a difference between the source voltage supplied to pixelelectrode 15 and the common voltage supplied to common electrode 16. Indisplay device 100, a liquid crystal is driven by the electric field tocontrol transmittance of light emitted from a backlight, therebydisplaying the image. In performing color display, a desired sourcevoltage is supplied to the source line connected to pixel electrode 15of pixel 14 corresponding to each of red, green, and blue colors thatare formed by a stripe-shaped color filter.

An example of an inspection method of the present exemplary embodimentwill be described below.

The inspection gate-on voltage is output from inspection drive circuit60 in FIG. 1, and supplied to the gate electrode of inspection thin filmtransistor 53 disposed in second edge side region 20B (see FIG. 1)through second inspection wiring 52 in FIG. 2, and inspection thin filmtransistor 53 to which the inspection gate-on voltage is supplied isturned on. In the present exemplary embodiment, because one of theplurality of second inspection wirings 52 is connected to at least twoinspection thin film transistors 53 as illustrated in FIG. 2, at leasttwo inspection thin film transistors 53 are turned on when theinspection gate-on voltage is supplied to one second inspection wiring52. For example, when the inspection gate-on voltage is supplied tosecond inspection wiring 52B disposed second from the left in FIG. 2,nine inspection thin film transistors 53 disposed first to ninth fromthe left in FIG. 2 are turned on.

When the nine inspection thin film transistors 53 disposed first toninth from the left in FIG. 2 are turned on, for example, first wirings31 disposed first, fourth, and seventh from the left and wiring 54Aextending in the second direction are electrically connected throughthree inspection thin film transistors 53. As illustrated in FIG. 2,because wiring 54A extending in the second direction and firstinspection wiring 51A are electrically connected to each other, thesignal is transmitted from first wirings 31 disposed first, fourth, andseventh from the left to first inspection wiring 51A. Presence orabsence of a defect such as a short circuit can be inspected in firstwirings 31 disposed first, fourth, and seventh from the left bymeasuring a voltage value or a current value using inspection circuit 50connected to first inspection wiring 51A. As described above, in thepresent exemplary embodiment, one of the plurality of first inspectionwirings 51 is electrically connected to at least two inspection thinfilm transistors 53, and at least two first wirings 31 connected to theat least two inspection thin film transistors 53 can be inspected usingone first inspection wiring 51. With this configuration, a number offirst inspection wirings 51 can be decreased, and the plurality of firstinspection wirings 51 can be arranged in a limited space of displayregion 10.

Similarly, the presence or absence of the defect can be inspected infirst wirings 31 disposed second, fifth, and eighth from the left bymeasuring the voltage value and the current value of first inspectionwiring 51B electrically connected through three inspection thin filmtransistors 53 and wiring 54B using the inspection circuit 50. Thepresence or absence of the defect can be inspected in first wirings 31disposed third, sixth, and ninth from the left by measuring the voltagevalue and the current value of first inspection wiring 51C electricallyconnected through three inspection thin film transistors 53 and wiring54C using the inspection circuit 50.

Subsequently, when the inspection gate-on voltage is supplied to secondinspection wiring 52A disposed first from the left in FIG. 2, nineinspection thin film transistors 53 disposed tenth to eighteenth fromthe left in FIG. 2 are turned on, and the presence or absence of thedefect can be inspected in nine first wirings 31 connected to nineinspection thin film transistors 53.

As described above, the plurality of inspection thin film transistors 53in each of which the gate electrode is connected to second inspectionwiring 52 are turn on by supplying the inspection gate-on voltage fromthe plurality of second inspection wirings 52 corresponding to eacharea. The presence or absence of the defect can be inspected in theplurality of first wirings 31 connected to the plurality of turned-oninspection thin film transistors 53 by measuring the current value andthe voltage value that are transmitted through first inspection wiring51.

In the example of FIG. 1, in frame region 20, second drive circuit 40 isdisposed in edge side region 20C intersecting with first edge sideregion 20A where first drive circuit 30 is disposed. Alternatively, asillustrated in FIG. 4, second drive circuit 40 may be disposed in firstedge side region 20A where first drive circuit 30 is disposed, ordisposed in second edge side region 20B that constitutes frame region 20and is opposed to first edge side region 20A. In the examples of FIGS. 4and 5, second drive circuit 40 is disposed in the first edge side region20A where first drive circuit 30 is disposed.

In the present exemplary embodiment, as illustrated in FIG. 5, displaydevice 100 includes a plurality of lead-out lines 42 extending in thefirst direction in display region 10. The plurality of lead-out lines 42electrically connect each of the plurality of second wirings 41 andsecond drive circuit 40. When the gate-on voltage is supplied fromsecond drive circuit 40 to the plurality of lead-out lines 42, thegate-on voltage is supplied to second wiring 41 connected to lead-outline 42, and thin film transistor 13 described above with reference toFIG. 3 is turned on.

In the present exemplary embodiment of FIGS. 4 and 5, inspection drivecircuit 60 and second drive circuit 40 described above with reference toFIGS. 1 and 2 are disposed in identical first edge side region 20A, sothat inspection drive circuit 60 can be included in second drive circuit40.

An example of a series of operations relating to the image display indisplay region 10 and the inspection of first wiring 31 in the presentexemplary embodiment in FIGS. 4 and 5 will be described below.

Second drive circuit 40 including inspection drive circuit 60 suppliesthe gate-on voltage to lead-out line 42A. When the gate-on voltage issupplied to lead-out line 42A, the gate-on voltage is supplied to secondwiring 41A through lead-out line 42A. With the supply of the gate-onvoltage, thin film transistor 13 (see FIG. 3) connected to second wiring41A is turned on, and the source voltage that is the source signal issupplied to pixel electrode 15 through the source line connected to thinfilm transistor 13. An electric field is generated by a differencebetween the source voltage supplied to pixel electrode 15 and the commonvoltage supplied to common electrode 16. The liquid crystal is driven bythe electric field to control the transmittance of the light emittedfrom the backlight, thereby displaying the image.

Subsequently, second drive circuit 40 supplies the gate-on voltage tolead-out line 42B. The supply of the gate-on voltage turns on thin filmtransistor 13 electrically connected to lead-out line 42B, and thesource voltage that is the source signal is supplied to pixel electrode15 through the source line connected to thin film transistor 13.

Second drive circuit 40 sequentially repeats this operation from thesupply of the gate-on voltage to the lead-out line 42A to the supply ofthe gate-on voltage to lead-out line 42G, whereby the image can bedisplayed in display region 10.

After displaying one image in display region 10, second drive circuit 40including inspection drive circuit 60 inspects first wiring 31 during ablank time until the display of the next image.

Specifically, after supplying the gate-on voltage to lead-out lines 42Ato 42G, second drive circuit 40 supplies the inspection gate-on voltageto second inspection wirings 52A to 52E. For example, when theinspection gate-on voltage is supplied to second inspection wiring 52Bdisposed second from the left in FIG. 5, the nine inspection thin filmtransistors 53 disposed first to ninth from the left in FIG. 5 areturned on.

The flow of the subsequent inspection is as described above withreference to FIG. 2.

In the configuration of FIGS. 4 and 5, second drive circuit 40 caninclude inspection drive circuit 60, first wiring 31 can be inspectedduring the blank time until the display of the next image after thedisplay of one image in display region 10.

Desirably the plurality of second inspection wirings 52 are disposedbetween the pixel electrodes in which the plurality of lead-out lines 42are not disposed. As a specific example, as illustrated in FIG. 5, whenlead-out line 42G is disposed between first pixel electrode 15A andsecond pixel electrode 15B that are adjacent to each other in the seconddirection, desirably second inspection wiring 52 is not disposed betweenfirst pixel electrode 15A and second pixel electrode 15B. When secondinspection wiring 52A is disposed between third pixel electrode 15C andfourth pixel electrode 15D that are adjacent to each other, desirablylead-out line 42 is not disposed between third pixel electrode 15C andfourth pixel electrode 15D. Desirably the disposition of secondinspection wiring 52 and lead-out line 42 is decided according to theconfiguration of a subpixel included in one pixel. For example, whenthree subpixels are arranged in the second direction in one pixel likeRGB, desirably one second inspection wiring 52 or one lead-out line 42is disposed for three first wirings 31. For example, when four subpixelsare arranged in the second direction in one pixel like RGBW, desirablyone second inspection wiring 52 or one lead-out line 42 is disposed fortwo or four first wirings 31.

With this configuration, ununiformity of an aperture ratio among theplurality of pixels included in display device 100 can be prevented.That is, ununiformity of the total number of second inspection wirings52 and lead-out lines 42 that traverse one pixel is prevented byadopting this configuration, so that the ununiformity of the apertureratio among the plurality of pixels included in display device 100 canbe prevented.

As illustrated in FIG. 5, at least a part of the plurality of firstinspection wirings 51 extends in the first direction in display region10, so that the space in which the inspection wiring 51 is disposed canbe reduced in frame region 20. Resultantly, the area of frame region 20can further be reduced.

As described above, in the configuration in which at least a part of theplurality of first inspection wirings 51 is disposed in display region10, desirably the plurality of first inspection wirings 51 is disposedbetween the pixel electrodes in which the plurality of second inspectionwirings 52 and the plurality of lead-out lines 42 are not disposed. As aspecific example, as illustrated in FIG. 5, when first inspection wiring51A is disposed between fifth pixel electrode 15E and sixth pixelelectrode 15F that are adjacent to each other in the second direction,desirably second inspection wiring 52 and lead-out line 42 are notdisposed between fifth pixel electrode 15E and sixth pixel electrode15F. Desirably first inspection wiring 51 is not disposed between firstpixel electrode 15A and second pixel electrode 15B in which lead-outline 42G is disposed. Similarly, desirably first inspection wiring 51 isnot disposed between third pixel electrode 15C and fourth pixelelectrode 15D in which second inspection wiring 52A is disposed.Desirably the disposition of first inspection wiring 51, secondinspection wiring 52, and lead-out line 42 is decided according to theconfiguration of the subpixel included in one pixel. For example, whenthe three subpixels are arranged in the second direction in one pixellike RGB, desirably one of one first inspection wiring 51, one secondinspection wiring 52, and one lead-out line 42 is disposed for threefirst wirings 31. For example, when the four subpixels are arranged inthe second direction in one pixel like RGBW, desirably one of one firstinspection wiring 51, one second inspection wiring 52, and one lead-outline 42 is disposed for two or four first wirings 31.

With this configuration, ununiformity of an aperture ratio among theplurality of pixels included in display device 100 can be prevented.That is, the ununiformity of the total number of first inspection wiring51, second inspection wirings 52, and lead-out lines 42 that traverseone pixel is prevented by adopting this configuration, so that theununiformity of the aperture ratio among the plurality of pixelsincluded in display device 100 can be prevented.

In the example of FIG. 5, the plurality of second inspection wirings 52and the plurality of lead-out lines 42 are disposed in differentregions, namely, the plurality of lead-out lines 42 are disposed in theleft region in FIG. 5, and the plurality of second inspection wirings 52are disposed in the right region from the center. However, the presentdisclosure is not limited to the example of FIG. 5.

For example, in a configuration of FIG. 6, at least one of the pluralityof second inspection wirings 52 extends between two lead-out lines 42adjacent to each other among the plurality of lead-out lines 42 inplanar view. As a specific example, second inspection wiring 52B extendsbetween lead-out lines 42B, 42C adjacent to each other, and secondinspection wiring 52C extends between lead-out lines 42D, 42E adjacentto each other. Similarly, second inspection wiring 52D extends betweenlead-out lines 42F, 42G adjacent to each other.

With this configuration, the plurality of second inspection wirings 52are dispersed and disposed in the second direction, so that routing ofsecond inspection wiring 52 can be simplified in second edge side region20B in FIG. 4. That is, each of the plurality of second inspectionwirings 52 is disposed at a position close to the area to which each ofthe plurality of second inspection wirings 52 corresponds, so that therouting of second inspection wirings 52 can be simplified in second edgeside region 20B.

In the configuration example of FIG. 6, second drive circuit 40including inspection drive circuit 60 may inspect first wiring 31 duringthe blank time, or inspect the plurality of first wirings 31 while oneimage is displayed in display region 10. As a specific example, seconddrive circuit 40 sequentially supplies the gate-on voltage or theinspection gate-on voltage in the order of second inspection wiring 52A,lead-out lines 42A, 42B, second inspection wiring 52B, lead-out lines42C, 42D, . . . , and second inspection wiring 52E from the left in thesecond direction of FIG. 6, and the plurality of first wirings 31 may beinspected while one image is displayed in display region 10.

In the examples of FIGS. 2, 5, and 6, the plurality of first inspectionwirings 51 are collectively disposed in the region on the right side inFIGS. 2, 5, and 6. However, the present disclosure is not limited to theexamples of FIGS. 2, 5, and 6.

For example, in a configuration of FIG. 7, at least one of the pluralityof first inspection wirings 51 extends between two lead-out lines 42adjacent to each other among the plurality of lead-out lines 42 inplanar view. As a specific example, first inspection wiring 51A extendsbetween lead-out lines 42B, 42C adjacent to each other, and firstinspection wiring 51B extends between lead-out lines 42F, 42G adjacentto each other.

With this configuration, the plurality of first inspection wirings 51are dispersed and disposed in the second direction, so that the routingof second inspection wiring 52 can be simplified in second edge sideregion 20B in FIG. 4. That is, by eliminating the region where firstinspection wirings 51 are collectively disposed, second inspectionwiring 52 can be disposed in the region where first inspection wirings51 are collectively disposed. For this reason, each of the plurality ofsecond inspection wirings 52 is disposed at a position closer to thearea to which each of the plurality of second inspection wirings 52corresponds, so that the routing of second inspection wirings 52 can besimplified in second edge side region 20B.

That is, in the configurations of FIGS. 2, 5, and 6, a part of secondinspection wiring 52 is routed in second edge side region 20B (see FIG.4). On the other hand, in the configuration of FIG. 7, the routing ofsecond inspection wiring 52 can be simplified, and the area of frameregion 20 can further be reduced.

In the above, the specific embodiments of the present application havebeen described, but the present application is not limited to theabove-mentioned embodiments, and various modifications may be made asappropriate without departing from the spirit of the presentapplication.

What is claimed is:
 1. A display device comprising: a display region; aframe region disposed around the display region; a plurality of firstwirings extending in a first direction in the display region; a firstdrive circuit electrically connected to one end of each of the pluralityof first wirings; a plurality of second wirings extending in a seconddirection intersecting with the first direction in the display region; asecond drive circuit electrically connected to the plurality of secondwirings; a plurality of lead-out lines that extend in the firstdirection and electrically connect each of the plurality of secondwirings and the second drive circuit in the display region; a pluralityof first inspection wirings electrically connected to another end ofeach of the plurality of first wirings through each of a plurality ofinspection thin film transistors; a plurality of second inspectionwirings connected to a gate electrode of each of the plurality ofinspection thin film transistors; an inspection drive circuitelectrically connected to at least one of the plurality of secondinspection wirings; an inspection circuit electrically connected to atleast part of the first inspection wirings; and a plurality of pixelelectrodes arrayed in the first direction and the second direction inthe display region, wherein at least a part of the second inspectionwirings extends in the first direction in the display region, and theplurality of pixel electrodes includes: a first pixel electrode and asecond pixel electrode adjacent to each other in the second direction;and a third pixel electrode and a fourth pixel electrode adjacent toeach other in the second direction, one of the plurality of lead-outlines extends between the first pixel electrode and the second pixelelectrode in planar view, one of the plurality of second inspectionwirings extends between the third pixel electrode and the fourth pixelelectrode in planar view, none of the plurality of second inspectionwirings is disposed between the first pixel electrode and the secondpixel electrode, and none of the plurality of lead-out lines is disposedbetween the third pixel electrode and the fourth pixel electrode.
 2. Thedisplay device according to claim 1, wherein the inspection drivecircuit is included in the second drive circuit.
 3. The display deviceaccording to claim 2, wherein the first drive circuit is disposed in afirst edge side region constituting the frame region, and the seconddrive circuit is disposed in the first edge side region, or disposed ina second edge side region that constitutes the frame region and isopposed to the first edge side region.
 4. The display device accordingto claim 1, wherein at least one of the plurality of second inspectionwirings extends between two adjacent lead-out lines of the plurality oflead-out lines in planar view.
 5. The display device according to claim1, wherein the plurality of pixel electrodes further includes a fifthpixel electrode and a sixth pixel electrode adjacent to each other inthe second direction, at least a part of the plurality of firstinspection wirings extends in the first direction in the display region,one of the plurality of first inspection wirings extends between thefifth pixel electrode and the sixth pixel electrode in planar view, noneof the plurality of first inspection wirings is disposed between thefirst pixel electrode and the second pixel electrode, and between thethird pixel electrode and the fourth pixel electrode, and none of theplurality of second inspection wirings and the plurality of lead-outlines is disposed between the fifth pixel electrode and the sixth pixelelectrode.
 6. The display device according to claim 5, wherein at leastone of the plurality of first inspection wirings extends between twoadjacent lead-out lines of the plurality of lead-out lines in planarview.
 7. The display device according to claim 1, wherein at least apart of the first inspection wiring extends in the first direction inthe display region.
 8. The display device according to claim 1, whereinat least part of the plurality of second inspection wirings is connectedto gate electrodes of at least two inspection thin film transistorsincluded in the plurality of inspection thin film transistors.
 9. Thedisplay device according to claim 1, wherein at least part of theplurality of first inspection wirings is electrically connected to atleast two inspection thin film transistors included in the plurality ofinspection thin film transistors.
 10. The display device according toclaim 1, wherein the inspection drive circuit is disposed in a firstedge side region constituting the frame region, the plurality ofinspection thin film transistors are disposed in a second edge sideregion that constitutes the frame region and is opposed to the firstedge side region, and at least a part of the plurality of secondinspection wirings is disposed in the second edge side region.
 11. Thedisplay device according to claim 1, wherein the inspection drivecircuit is disposed in a first edge side region constituting the frameregion, and the inspection circuit is disposed in the first edge sideregion.